Feature correspondences From Multiple Views of Coplanar Ellipses

Abstract : We address the problem of feature correspondences in images of coplanar ellipses with objective to benefit of robust ellipse fitting algorithm. The main difficulty is the lack of projective invariant points immediately available. Therefore, our key idea is to construct virtual line and point features using the property of tangent invariance under perspective projection. The proposed method requires first a robust detection of ellipse edge points to fit a parametric model on each ellipse. The feature lines are then obtained by computing the 4 bitangents to each couple of ellipses. The points are derived by considering the tangent points and the intersection points between bitangents. Results of experimental studies are presented to demonstrate the reliability and robustness of the feature extraction process. Subpixel accuracy is easily achieved. A real application to camera self-calibration is also described.