Pulsed X-Ray and Continuous Gamma Radiation Effects on Erbium Doped Optical Fibers Properties

B. Tortech 1 A. Gusarov 2 M. van Uffelen 2 J. Bisutti 1, 3 Sébastien Girard 3 Y. Ouerdane 1 A. Boukenter 1 J.-P. Meunier 1 F. Berghmans 4 H. Thienpont 4
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 SCK-CEN - Centre d'Etude de l'Energie Nucléaire
3 DAM/DIF - DAM Île-de-France
4 VUB - Vrije Universiteit [Brussels]
Abstract : Abstract—The radiation responses of two erbium doped fibers are studied in harsh pulsed X-ray and gamma ray environments. Their transient and continuous responses were measured in the near-infrared spectral range. The online transmission measurements of Radiation-Induced Attenuation (RIA) show no detectable change in the 1450–1600 nm erbium-ions-absorption domain, whereas the background losses from the silica-based host matrix are strongly increased by the creation of point defects. For both harsh environments, the rare-earth doped samples exhibit higher RIA levels compared than standard passive optical fibers. From all our measurements, we proposed that the main contribution to the induced losses is due to the radiation-induced changes of the host matrix rather than changes related to erbium ions. Photo-luminescence analyses confirm the generation of NBOHC in erbium doped fibers and suggest the existence of energy transfer between the radiation-induced point defects and the Er3+ ions
Keywords : Erbium gamma-ray effects luminescence optical fibers X-ray effects
Document type :
Journal articles
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https://hal-ujm.archives-ouvertes.fr/ujm-00197338
Contributor : Youcef Ouerdane <>
Submitted on : Friday, December 14, 2007 - 3:04:45 PM
Last modification on : Tuesday, August 20, 2019 - 6:14:02 PM

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UNIV-ST-ETIENNE | CEA | LAHC | CNRS | IOGS | PARISTECH | DAM

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B. Tortech, A. Gusarov, M. van Uffelen, J. Bisutti, Sébastien Girard, et al.. Pulsed X-Ray and Continuous Gamma Radiation Effects on Erbium Doped Optical Fibers Properties. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2007, 54 (6), pp.2598-2603. ⟨10.1109/TNS.2007.908786⟩. ⟨ujm-00197338⟩

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