Second benchmark for the characterization of subwavelength diffractive elements

Nathalie Destouches 1 Pierre Chavel 2 Philippe Lalanne 3 I. Mustonen H. Ottevaere N. Passilly S. Pereira S. Reynaud 1 Jean-Claude Rodier 3 L. Steinbock J. van Erps C. Ziebert
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 Laboratoire Charles Fabry de l'Institut d'Optique / Scop
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
3 Laboratoire Charles Fabry de l'Institut d'Optique / Naphel
LCFIO - Laboratoire Charles Fabry de l'Institut d'Optique
Document type :
Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-00200385
Contributor : Nathalie Destouches <>
Submitted on : Thursday, December 20, 2007 - 5:06:54 PM
Last modification on : Wednesday, July 25, 2018 - 2:05:30 PM

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  • HAL Id : ujm-00200385, version 1

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UNIV-ST-ETIENNE | LAHC | LCF_NAPHEL | IOGS | PARISTECH | LCFIO | LCF_SCOP

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Nathalie Destouches, Pierre Chavel, Philippe Lalanne, I. Mustonen, H. Ottevaere, et al.. Second benchmark for the characterization of subwavelength diffractive elements. Assembly meeting and General Scientific Networking Meeting of the European Network of excellence NEMO, May 2007, Florence, Italy. ⟨ujm-00200385⟩

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