https://hal-ujm.archives-ouvertes.fr/ujm-00290782 Contributor : Manuel FluryConnect in order to contact the contributor Submitted on : Thursday, June 26, 2008 - 2:38:13 PM Last modification on : Wednesday, March 23, 2022 - 3:50:22 PM
Manuel Flury, Gilles Patriache, David Troadec, Olivier Parriaux. TEM analysis of ion plated HfO2/SiO2 multilayers for femtosecond lasers. 7th Symposium SiO2, advanced dielectrics and related devices, Jul 2008, France. p. ⟨ujm-00290782⟩