Influence of Si-chemical bonding on the semiconductive and anti-corrosion properties of Si-C-N coatings

D. Pech 1 A.-S. Loir 2 Philippe Steyer 1 J.-C. Sanchez-Lopez 3 Y. Gachon C. Héau
1 MATEIS - Matériaux, ingénierie et science [Villeurbanne]
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
3 ICMSE - Instituto de Ciencia de Materiales de Sevilla
Document type :
Conference papers
Complete list of metadatas
https://hal-ujm.archives-ouvertes.fr/ujm-00356435
Contributor : Anne-Sophie Loir <>
Submitted on : Tuesday, January 27, 2009 - 2:59:11 PM
Last modification on : Friday, October 26, 2018 - 10:46:59 AM

Identifiers

  • HAL Id : ujm-00356435, version 1

Collections

UNIV-ST-ETIENNE | INSA-LYON | LAHC | UNIV-LYON1 | MATEIS | IOGS | PARISTECH | INSA-GROUPE

Citation

D. Pech, A.-S. Loir, Philippe Steyer, J.-C. Sanchez-Lopez, Y. Gachon, et al.. Influence of Si-chemical bonding on the semiconductive and anti-corrosion properties of Si-C-N coatings. 10th International Conference on Plasma and Surface Engineering, PSE 2006, Sep 2006, Garmisch-Partenkirchen, Germany. ⟨ujm-00356435⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

77

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD