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Communication Dans Un Congrès Année : 2006

Influence of Si-chemical bonding on the semiconductive and anti-corrosion properties of Si-C-N coatings

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ujm-00356435 , version 1 (27-01-2009)

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  • HAL Id : ujm-00356435 , version 1

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D. Pech, A.-S. Loir, Philippe Steyer, J.-C. Sanchez-Lopez, Y. Gachon, et al.. Influence of Si-chemical bonding on the semiconductive and anti-corrosion properties of Si-C-N coatings. 10th International Conference on Plasma and Surface Engineering, PSE 2006, Sep 2006, Garmisch-Partenkirchen, Germany. ⟨ujm-00356435⟩
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