Micro-inductance method to measure the permeability of magnetic thin films–limits of validity

O. Jalled; A. Siblini; T. Boudiar; S. Capraro; Jean-Pierre Chatelon

Journal Articles physica status solidi (c) Year : 2004

Micro-inductance method to measure the permeability of magnetic thin films–limits of validity

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1

O. Jalled

Function : Author

Dispositifs et Instrumentation en Optoélectronique et micro-ondes

A. Siblini

Function : Author

Dispositifs et Instrumentation en Optoélectronique et micro-ondes

T. Boudiar

Function : Author

Dispositifs et Instrumentation en Optoélectronique et micro-ondes

S. Capraro

Function : Author

Dispositifs et Instrumentation en Optoélectronique et micro-ondes

Jean-Pierre Chatelon

Function : Author
PersonId : 10094
IdHAL : jean-pierre-chatelon
IdRef : 136271499

Dispositifs et Instrumentation en Optoélectronique et micro-ondes

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Engineering Sciences [physics] Micro and nanotechnologies/Microelectronics

Jean-Pierre Chatelon : Connect in order to contact the contributor

https://hal-ujm.archives-ouvertes.fr/ujm-00356459

Submitted on : Tuesday, January 27, 2009-3:18:52 PM

Last modification on : Saturday, March 18, 2023-3:51:48 AM

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ujm-00356459 , version 1 (27-01-2009)

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HAL Id : ujm-00356459 , version 1

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O. Jalled, A. Siblini, T. Boudiar, S. Capraro, Jean-Pierre Chatelon. Micro-inductance method to measure the permeability of magnetic thin films–limits of validity. physica status solidi (c), 2004, 1 (12), pp.3673-3676. ⟨ujm-00356459⟩

Micro-inductance method to measure the permeability of magnetic thin films–limits of validity

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