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Micro-inductance method to measure the permeability of magnetic thin films–limits of validity

O. Jalled 1 A. Siblini 1 T. Boudiar 1 S. Capraro 1 Jean-Pierre Chatelon 1
1 DIOM - Dispositifs et Instrumentation en Optoélectronique et micro-ondes
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https://hal-ujm.archives-ouvertes.fr/ujm-00356459
Contributor : Jean-Pierre Chatelon Connect in order to contact the contributor
Submitted on : Tuesday, January 27, 2009 - 3:18:52 PM
Last modification on : Wednesday, November 20, 2019 - 3:01:55 AM

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  • HAL Id : ujm-00356459, version 1

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UNIV-ST-ETIENNE | UDL

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O. Jalled, A. Siblini, T. Boudiar, S. Capraro, Jean-Pierre Chatelon. Micro-inductance method to measure the permeability of magnetic thin films–limits of validity. physica status solidi (c), Wiley, 2004, 1 (12), pp.3673-3676. ⟨ujm-00356459⟩

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Les métriques sont temporairement indisponibles