Skip to Main content Skip to Navigation
Journal articles

Micro-inductance method to measure the permeability of magnetic thin films–limits of validity

O. Jalled 1 A. Siblini 1 T. Boudiar 1 S. Capraro 1 Jean-Pierre Chatelon 1
1 DIOM - Dispositifs et Instrumentation en Optoélectronique et micro-ondes
Document type :
Journal articles
Complete list of metadatas
https://hal-ujm.archives-ouvertes.fr/ujm-00356459
Contributor : Jean-Pierre Chatelon <>
Submitted on : Tuesday, January 27, 2009 - 3:18:52 PM
Last modification on : Wednesday, November 20, 2019 - 3:01:55 AM

Identifiers

  • HAL Id : ujm-00356459, version 1

Collections

UNIV-ST-ETIENNE | UDL

Citation

O. Jalled, A. Siblini, T. Boudiar, S. Capraro, Jean-Pierre Chatelon. Micro-inductance method to measure the permeability of magnetic thin films–limits of validity. physica status solidi (c), Wiley, 2004, 1 (12), pp.3673-3676. ⟨ujm-00356459⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

157