Ellipsometry on a planar s-shape metamaterial

E. Verney (1) , F. Gambou (1)

1 LT2C - Laboratoire Telecom Claude Chappe

In this paper we present the results of ellipsometry on a grid of S-shape particles engraved on an epoxy substrate. We show the value of the ellipticity and the tilt angle of the principal axis of ellipsis of the transmitted wave as a function to the angle between the polarisation of the incident plane wave and the principal axis of the particles. The optical axes of the material are found, and the dependence of the absorption to the angle of polarisation is shown. Using a least squares method with the measurements, we calculate the dichroism and the birefringence of the material.

Mots clés: metamaterial; ellipsometry

Domaines: Electromagnétisme

E. Verney, F. Gambou. Ellipsometry on a planar s-shape metamaterial. Progress In Electromagnetics Research Letters, 2009, 9 (-), pp.1-8. ⟨10.2528/PIERL09050505⟩. ⟨ujm-00733371⟩