Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment

V. Goiffon 1 Sébastien Girard 2 P. Paillet 3 P. Magnan 1 A. Chabane 1 A. Rousseau 3 S. Darbon 3 P. Cervantes 1 J.L. Bourgade 3
1 ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
3 DAM - Direction des Applications Militaires
Abstract : Presented is a new mitigation technique to improve the radiation tolerance of CMOS image sensors to the radiation constraints associated to the fusion by inertial confinement experiments at megajoule class laser facilities. Using the global reset mode, results acquired at the OMEGA facility show the efficiency of this technique to reduce by more than 70% the number of white pixels induced by the mixed 14 MeV neutron and gamma-ray pulse.
Document type :
Journal articles
Complete list of metadatas
https://hal-ujm.archives-ouvertes.fr/ujm-00747245
Contributor : Youcef Ouerdane <>
Submitted on : Tuesday, October 30, 2012 - 5:49:43 PM
Last modification on : Monday, October 15, 2018 - 3:46:02 PM

Identifiers

Collections

UNIV-ST-ETIENNE | CEA | LAHC | DAM | IOGS | PARISTECH

Citation

V. Goiffon, Sébastien Girard, P. Paillet, P. Magnan, A. Chabane, et al.. Mitigation technique for use of CMOS image sensors in megajoule class laser radiative environment. Electronics Letters, IET, 2012, 48 (21), pp.1338-1339. ⟨10.1049/el.2012.2667⟩. ⟨ujm-00747245⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

114

Contact

CCSD