B. Abdel Samad, M.-F. Blanc-Mignon, Mohamad Roumie, A. Siblini, Jean-Pierre Chatelon, et al.. Physico-chemical characterization of multilayer YIG thin film deposited by rf sputtering.
European Physical Journal: Applied Physics, EDP Sciences, 2010, 50, pp.10502.
⟨10.1051/epjap/2010026⟩.
⟨ujm-00788601⟩