Improvement and characterization of morphological properties of a micro-inductance in a multi-layer structure - Archive ouverte HAL Access content directly
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Improvement and characterization of morphological properties of a micro-inductance in a multi-layer structure

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ujm-00795870 , version 1 (01-03-2013)

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  • HAL Id : ujm-00795870 , version 1

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Ismail Khalil, Jean-Pierre Chatelon, A. Siblini, M.-F. Blanc-Mignon, Jean-Jacques Rousseau. Improvement and characterization of morphological properties of a micro-inductance in a multi-layer structure. Seeheim Conference on Magnetism, Mar 2010, Frankfurt, Germany. ⟨ujm-00795870⟩
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