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Université Jean Monnet – Saint-Etienne |  |
Conference papers
The effect of oxygen flow rate on the properties of YIG thin films prepared by rf-magnetron sputtering
Jean-Pierre Chatelon 1
Author IdHAL : jean-pierre-chatelon
M. Korek
Author
1
LT2C - Laboratoire Telecom Claude Chappe (LT2C Télécom Saint-Etienne 25 rue Dr Rémy Annino 42000 Saint-Etienne Cedex 2 - France)
- UJM - Université Jean Monnet [Saint-Étienne] : EA3523 (10 rue Tréfilerie - 42100 Saint-Étienne - France)
- Ecole d'ingenieurs Telecom Saint Etienne (France)
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Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-00795876
Contributor : Jean-Pierre Chatelon <>
Submitted on : Friday, March 1, 2013 - 9:42:16 AM
Last modification on : Thursday, November 21, 2019 - 2:35:54 AM
Contributor : Jean-Pierre Chatelon <>
Submitted on : Friday, March 1, 2013 - 9:42:16 AM
Last modification on : Thursday, November 21, 2019 - 2:35:54 AM
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- HAL Id : ujm-00795876, version 1
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Citation
B. Abdel Samad, A. Siblini, M.-F. Blanc-Mignon, Mohamad Roumie, Jean-Pierre Chatelon, et al.. The effect of oxygen flow rate on the properties of YIG thin films prepared by rf-magnetron sputtering. Mediterranean Conference on Innovative Materials and Applications (CIMA), Mar 2011, Beirut, Lebanon. ⟨ujm-00795876⟩
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