https://hal-ujm.archives-ouvertes.fr/ujm-00802509
Contributor : Bernard Bayard
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Submitted on : Wednesday, March 20, 2013 - 8:42:05 AM
Last modification on : Wednesday, July 25, 2018 - 2:05:30 PM
Frank Gambou, Bernard Bayard, Gérard Noyel. Characterization of material anisotropy using microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2011, 53 (9), pp.1996-1998. ⟨ujm-00802509⟩
