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Characterization of material anisotropy using microwave ellipsometry

Frank Gambou 1 Bernard Bayard 2, 1 Gérard Noyel 1
1 LT2C - Laboratoire Telecom Claude Chappe
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
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https://hal-ujm.archives-ouvertes.fr/ujm-00802509
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Wednesday, March 20, 2013 - 8:42:05 AM
Last modification on : Monday, January 13, 2020 - 5:46:02 PM

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  • HAL Id : ujm-00802509, version 1

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UNIV-ST-ETIENNE | CNRS | LAHC | IOGS | PARISTECH | UDL

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Frank Gambou, Bernard Bayard, Gérard Noyel. Characterization of material anisotropy using microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2011, 53 (9), pp.1996-1998. ⟨ujm-00802509⟩

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