Characterization of material anisotropy using microwave ellipsometry

Document type :
Journal articles
Complete list of metadatas

https://hal-ujm.archives-ouvertes.fr/ujm-00802509
Contributor : Bernard Bayard <>
Submitted on : Wednesday, March 20, 2013 - 8:42:05 AM
Last modification on : Wednesday, July 25, 2018 - 2:05:30 PM

Identifiers

  • HAL Id : ujm-00802509, version 1

Collections

Citation

Frank Gambou, Bernard Bayard, Gérard Noyel. Characterization of material anisotropy using microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2011, 53 (9), pp.1996-1998. ⟨ujm-00802509⟩

Share

Metrics

Record views

136