Journal Articles
Microwave and Optical Technology Letters
Year : 2011
Bernard Bayard : Connect in order to contact the contributor
https://hal-ujm.archives-ouvertes.fr/ujm-00802509
Submitted on : Wednesday, March 20, 2013-8:42:05 AM
Last modification on : Friday, March 24, 2023-2:52:56 PM
Dates and versions
Identifiers
- HAL Id : ujm-00802509 , version 1
Cite
Frank Gambou, Bernard Bayard, Gérard Noyel. Characterization of material anisotropy using microwave ellipsometry. Microwave and Optical Technology Letters, 2011, 53 (9), pp.1996-1998. ⟨ujm-00802509⟩
52
View
0
Download