A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range

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Submitted on : Wednesday, March 20, 2013 - 9:45:12 AM
Last modification on : Tuesday, July 23, 2019 - 2:38:11 PM

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D. Vincent, T. Rouiller, C. R. Simovski, Bernard Bayard, Gérard Noyel. A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range. IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2005, 53 (4), pp.1174-1180. ⟨ujm-00802549⟩

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