Skip to Main content Skip to Navigation
Journal articles

A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range

D. Vincent 1 T. Rouiller C. R. Simovski Bernard Bayard 1 Gérard Noyel 1
1 LT2C - Laboratoire Telecom Claude Chappe
Document type :
Journal articles
Complete list of metadata
https://hal-ujm.archives-ouvertes.fr/ujm-00802549
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Wednesday, March 20, 2013 - 9:45:12 AM
Last modification on : Wednesday, November 20, 2019 - 3:13:59 AM

Identifiers

  • HAL Id : ujm-00802549, version 1

Collections

UNIV-ST-ETIENNE | UDL

Citation

D. Vincent, T. Rouiller, C. R. Simovski, Bernard Bayard, Gérard Noyel. A New Broad-Band Method for Magnetic Thin-Film Characterization in the Microwave Range. IEEE Transactions on Microwave Theory and Techniques, Institute of Electrical and Electronics Engineers, 2005, 53 (4), pp.1174-1180. ⟨ujm-00802549⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Les métriques sont temporairement indisponibles