M. Gaillardin, Sylvain Girard, Philippe Paillet, Jean-Luc Leray, V. Goiffon, et al.. Investigations on the Vulnerability of Advanced CMOS Technologies to MGy Dose Environments.
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2013, 60 (4), pp.2590 - 2597.
⟨10.1109/TNS.2013.2249095⟩.
⟨ujm-00854044⟩