M. Gaillardin, Melanie Raine, O. Duhamel, Sylvain Girard, Philippe Paillet, et al.. Impact of mechanical strain on the charge collection mechanisms of nanometer scaled SOI devices under heavy ion and pulsed laser irradiation.
Conference Radiation and Its Effects on Components and Systems (RADECS 2013), Sep 2013, Oxford, United Kingdom. pp.XX.
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