Vincent Goiffon, Cédric Virmontois, Pierre Magnan, Sylvain Girard, Philippe Paillet. Analysis of Total Dose-Induced Dark Current in CMOS Image Sensors From Interface State and Trapped Charge Density Measurements.
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2010, 57 (6), pp.3087 - 3094.
⟨10.1109/TNS.2010.2077653⟩.
⟨ujm-01011648⟩