Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine 1 M. Gaillardin 1 Philippe Paillet 1 O. Duhamel 1 Sylvain Girard 1 A. Bournel
1 DAM/DIF - DAM Île-de-France
Abstract : Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.
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Journal articles
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https://hal-ujm.archives-ouvertes.fr/ujm-01011676
Contributor : Sylvain Girard <>
Submitted on : Tuesday, June 24, 2014 - 12:08:00 PM
Last modification on : Monday, October 15, 2018 - 3:54:03 PM

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CEA | UNIV-ST-ETIENNE | DAM

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Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2664 - 2672. ⟨10.1109/TNS.2011.2172985⟩. ⟨ujm-01011676⟩

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