Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine (1) , M. Gaillardin (1) , Philippe Paillet (1) , O. Duhamel (1) , Sylvain Girard (1) , A. Bournel

1 DAM/DIF - DAM Île-de-France

Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.

Domains: Engineering Sciences [physics]

Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2664 - 2672. ⟨10.1109/TNS.2011.2172985⟩. ⟨ujm-01011676⟩