Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices - Université Jean-Monnet-Saint-Étienne Access content directly
Journal Articles IEEE Transactions on Nuclear Science Year : 2011

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine
  • Function : Author
M. Gaillardin
  • Function : Author
Philippe Paillet
  • Function : Author
  • PersonId : 951923
O. Duhamel
  • Function : Author
Sylvain Girard
A. Bournel
  • Function : Author

Abstract

Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.
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Dates and versions

ujm-01011676 , version 1 (24-06-2014)

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Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, 2011, 58 (6), pp.2664 - 2672. ⟨10.1109/TNS.2011.2172985⟩. ⟨ujm-01011676⟩
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