Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine; M. Gaillardin; Philippe Paillet; O. Duhamel; Sylvain Girard; A. Bournel

doi:10.1109/TNS.2011.2172985

Journal articles

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine ¹ M. Gaillardin ¹ Philippe Paillet ¹ O. Duhamel ¹ Sylvain Girard ¹ A. Bournel

Abstract : Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.

Document type :

Journal articles

Domain :

Engineering Sciences [physics]

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https://hal-ujm.archives-ouvertes.fr/ujm-01011676
Contributor : Sylvain Girard <>
Submitted on : Tuesday, June 24, 2014 - 12:08:00 PM
Last modification on : Tuesday, November 19, 2019 - 12:58:32 PM

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

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Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

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