Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine; M. Gaillardin; Philippe Paillet; O. Duhamel; Sylvain Girard; A. Bournel

doi:10.1109/TNS.2011.2172985

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Melanie Raine ¹ M. Gaillardin ¹ Philippe Paillet ¹ O. Duhamel ¹ Sylvain Girard ¹ A. Bournel

Abstract : Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.

Type de document :

Article dans une revue

IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2664 - 2672. 〈10.1109/TNS.2011.2172985〉

Domaine :

Sciences de l'ingénieur [physics]

Liste complète des métadonnées

https://hal-ujm.archives-ouvertes.fr/ujm-01011676
Contributeur : Sylvain Girard <>
Soumis le : mardi 24 juin 2014 - 12:08:00
Dernière modification le : lundi 15 octobre 2018 - 15:54:03

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

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Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

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