Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Abstract : Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.
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IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2664 - 2672. 〈10.1109/TNS.2011.2172985〉
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https://hal-ujm.archives-ouvertes.fr/ujm-01011676
Contributeur : Sylvain Girard <>
Soumis le : mardi 24 juin 2014 - 12:08:00
Dernière modification le : jeudi 26 juillet 2018 - 12:08:52

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Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2664 - 2672. 〈10.1109/TNS.2011.2172985〉. 〈ujm-01011676〉

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