Skip to Main content Skip to Navigation
Journal articles

Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices

Abstract : Experimental data are reported, showing that heavy-ion induced deposited energy dispersion increases with decreasing sensitive layer thickness. Geant4 simulations provide insight into the mechanisms involved. Implications for device testing and radiation hardness assurance are discussed.
Complete list of metadatas

https://hal-ujm.archives-ouvertes.fr/ujm-01011676
Contributor : Sylvain Girard <>
Submitted on : Tuesday, June 24, 2014 - 12:08:00 PM
Last modification on : Tuesday, November 19, 2019 - 12:58:32 PM

Identifiers

Collections

Citation

Melanie Raine, M. Gaillardin, Philippe Paillet, O. Duhamel, Sylvain Girard, et al.. Experimental Evidence of Large Dispersion of Deposited Energy in Thin Active Layer Devices. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.2664 - 2672. ⟨10.1109/TNS.2011.2172985⟩. ⟨ujm-01011676⟩

Share

Metrics

Record views

104