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Université Jean Monnet – Saint-Etienne |  |
Journal articles
Total Ionizing Dose versus Displacement Damage Dose Induced Dark Current Random Telegraph Signal in CMOS Image Sensors
Cédric Virmontois
1
Vincent Goiffon
1
P. Magnan
1
O. Saint-Pé
2
Sylvain Girard
3
S. Petit
4
Guy Rolland
4
A. Bardoux
4
Sylvain Girard 3
Author IdHAL : sylvain-girard-ujm
S. Petit 4
Author
Guy Rolland 4
Author
A. Bardoux 4
Author
1
ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace (ISAE - 10 av. Edouard Belin - BP 54032 - 31055 TOULOUSE Cedex 4 - France)
2
Astrium [Toulouse] (31 rue des Cosmonautes, Z.I. du Palays, F-31402 Toulouse Cedex 4 - France)
3
DAM/DIF - DAM Île-de-France (CEA Bruyères-le-Châtel 91297 Arpajon cedex - France)
- DAM - Direction des Applications Militaires : DAM/DIF (France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DAM (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
4
CNES - Centre National d'Études Spatiales [Toulouse] (18 avenue Edouard Belin 31401 Toulouse - France)
Abstract : Dark current Random Telegraph Signals due to total ionizing dose (TID) and displacement damage dose (DDD) are investigated in CMOS image sensors. Discrepancies between both RTS are emphasised to better understand the microscopic origins of the phenomena.
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Journal articles
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https://hal-ujm.archives-ouvertes.fr/ujm-01011679
Contributor : Sylvain Girard Connect in order to contact the contributor
Submitted on : Tuesday, June 24, 2014 - 12:15:29 PM
Last modification on : Tuesday, November 19, 2019 - 12:58:54 PM
Contributor : Sylvain Girard Connect in order to contact the contributor
Submitted on : Tuesday, June 24, 2014 - 12:15:29 PM
Last modification on : Tuesday, November 19, 2019 - 12:58:54 PM
Identifiers
- HAL Id : ujm-01011679, version 1
- DOI : 10.1109/TNS.2011.2171005
Collections
CEA | UNIV-ST-ETIENNE | DAM | UDL
Citation
Cédric Virmontois, Vincent Goiffon, P. Magnan, O. Saint-Pé, Sylvain Girard, et al.. Total Ionizing Dose versus Displacement Damage Dose Induced Dark Current Random Telegraph Signal in CMOS Image Sensors. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (6), pp.3085 - 3094. ⟨10.1109/TNS.2011.2171005⟩. ⟨ujm-01011679⟩
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