 |
Université Jean Monnet – Saint-Etienne |  |
Journal articles
Chirality distribution in single walled carbon nanotube films by spectroscopic ellipsometry
Abstract : We report an experimental technique that determines the chirality distribution in single wall carbon
nanotube (SWCNT) films. Films of CoMoCat SWCNTs and SWCNTs enriched in (6,5) chirality
are considered. Classical methods like photoluminescence spectroscopy frequently give incomplete
distribution. In this way, spectroscopic ellipsometry is used to determine the dielectric function of
SWCNT film. The chirality abundance obtained by analysing the ellipsometric data with a tight
binding model is compared with that deduced from photoluminescence excitation spectroscopy.
We demonstrate that ellipsometry is an efficient tool for a complete and quantitative determination
of the chirality distribution and the metallic/semiconducting ratio.
Cited literature [26 references]
https://hal-ujm.archives-ouvertes.fr/ujm-01025762
Contributor : Damien Jamon Connect in order to contact the contributor
Submitted on : Thursday, May 11, 2017 - 2:13:48 PM
Last modification on : Friday, October 22, 2021 - 10:46:01 AM
Long-term archiving on: : Saturday, August 12, 2017 - 1:31:28 PM
Contributor : Damien Jamon Connect in order to contact the contributor
Submitted on : Thursday, May 11, 2017 - 2:13:48 PM
Last modification on : Friday, October 22, 2021 - 10:46:01 AM
Long-term archiving on: : Saturday, August 12, 2017 - 1:31:28 PM
File
12E4795154.pdf
Publisher files allowed on an open archive