Vulnerability of OFDR-based distributed sensors to high γ-ray doses

Serena Rizzolo 1 Aziz Boukenter 1 Emmanuel Marin 1 Marco Cannas 2 Jocelyn Perisse 3 Bauer Sophie Jean-Reynald Macé 3 Youcef Ouerdane 1 Sylvain Girard 1
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 Università degli studi di Palermo - University of Palermo
3 AREVA NP
Abstract : Vulnerability of Optical Frequency Domain Reflectometry (OFDR) based sensors to high γ-ray doses (up to 10 MGy) is evaluated with a specific issue of a radiation-hardened temperature and strain monitoring system for nuclear industry. For this, we characterize the main radiation effects that are expected to degrade the sensor performances in such applicative domain: the radiation-induced attenuation (RIA), the possible evolution with the dose of the Rayleigh scattering phenomenon as well as its dependence on temperature and strain. This preliminary investigation is done after the irradiation and for five different optical fiber types covering the range from radiation-hardened fibers to highly radiation sensitive ones. Our results show that at these high dose levels the scattering mechanism at the basis of the used technique for the monitoring is unaffected (changes below 5%), authorizing acceptable precision on the temperature or strain measurements. RIA has to be considered as it limits the sensing range. From our vulnerability study, the OFDR sensors appear as promising candidates for nuclear industry even at doses as high as 10 MGy.
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Article dans une revue
Optics Express, Optical Society of America, 2015, 23 (15), pp.18997-19009. 〈10.1364/OE.23.018997〉
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https://hal-ujm.archives-ouvertes.fr/ujm-01185797
Contributeur : Sylvain Girard <>
Soumis le : vendredi 21 août 2015 - 15:19:19
Dernière modification le : mardi 30 octobre 2018 - 17:00:02

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UNIV-ST-ETIENNE | LAHC | IOGS | PARISTECH | UNIV-PARIS-SACLAY

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Serena Rizzolo, Aziz Boukenter, Emmanuel Marin, Marco Cannas, Jocelyn Perisse, et al.. Vulnerability of OFDR-based distributed sensors to high γ-ray doses. Optics Express, Optical Society of America, 2015, 23 (15), pp.18997-19009. 〈10.1364/OE.23.018997〉. 〈ujm-01185797〉

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