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Université Jean Monnet – Saint-Etienne |  |
Poster communications
Investigations on MGy Total Ionizing Dose Effects in CMOS Technologies
M. Gaillardin
1
Philippe Paillet
1
Vincent Goiffon
2
Martial Martinez
1
Sylvain Girard
3
Melanie Raine
1
Claude Marcandella
1
Duhamel Olivier
1
Pierre Magnan
2
Sylvain Girard 3
Author IdHAL : sylvain-girard-ujm
Melanie Raine 1
Author
Claude Marcandella 1
Author
Duhamel Olivier 1
Author
Pierre Magnan 2
Author
1
DAM/DIF - DAM Île-de-France (CEA Bruyères-le-Châtel 91297 Arpajon cedex - France)
- DAM - Direction des Applications Militaires : DAM/DIF (France)
- CEA - Commissariat à l'énergie atomique et aux énergies alternatives : DAM (Centre de Saclay Centre de Grenoble Centre de Cadarache etc - France)
2
ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace (ISAE - 10 av. Edouard Belin - BP 54032 - 31055 TOULOUSE Cedex 4 - France)
3
LHC - Laboratoire Hubert Curien [Saint Etienne] (18 rue du Professeur Lauras 42000 SAINT-ETIENNE - France)
- UJM - Université Jean Monnet [Saint-Étienne] (10 rue Tréfilerie - 42100 Saint-Étienne - France)
- CNRS - Centre National de la Recherche Scientifique : UMR5516 (France)
- IOGS - Institut d'Optique Graduate School (2 avenue Augustin Fresnel, 91127 Palaiseau Cedex - France)
Abstract : This work investigates MGy Total Ionizing Dose effects in CMOS technologies. Large TID-induced electrical shifts are observed in devices with thin dielectrics. Trapping and detrapping properties are discussed using dedicated irradiation/annealing experiments
Document type :
Poster communications
Domain :
Complete list of metadatas
https://hal-ujm.archives-ouvertes.fr/ujm-01185833
Contributor : Sylvain Girard <>
Submitted on : Friday, August 21, 2015 - 4:07:30 PM
Last modification on : Monday, January 13, 2020 - 5:46:05 PM
Contributor : Sylvain Girard <>
Submitted on : Friday, August 21, 2015 - 4:07:30 PM
Last modification on : Monday, January 13, 2020 - 5:46:05 PM
Identifiers
- HAL Id : ujm-01185833, version 1
Collections
UNIV-ST-ETIENNE | CNRS | CEA | LAHC | IOGS | PARISTECH | UNIV-PARIS-SACLAY | DAM | UDL
Citation
M. Gaillardin, Philippe Paillet, Vincent Goiffon, Martial Martinez, Sylvain Girard, et al.. Investigations on MGy Total Ionizing Dose Effects in CMOS
Technologies. Nuclear and Space Radiation Effects Conference (NSREC 2015), Jul 2015, Boston, United States. ⟨ujm-01185833⟩
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