Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

Vincent Goiffon; Franck Corbière; S. Rolando; Magali Estribeau; Pierre Magnan; B. Avon; J. Baer; M. Gaillardin; R. Molina; Philippe Paillet; Sylvain Girard; Aziouz Chabane; Claude Marcandella

Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

Vincent Goiffon ¹ Franck Corbière ¹ S. Rolando ¹ Magali Estribeau ¹ Pierre Magnan ¹ B. Avon ¹ J. Baer ¹ M. Gaillardin ² R. Molina ¹ Philippe Paillet ² Sylvain Girard ³ Aziouz Chabane ¹ Claude Marcandella ²

1 ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace

2 DAM/DIF - DAM Île-de-France

3 LHC - Laboratoire Hubert Curien [Saint Etienne]

Abstract : The radiation hardness of a radiation-hardened-by-design CMOS Image Sensor is validated up to several MGy(SiO2) (>100 Mrad) of TID. The perspectives in terms of further improvements and applications are discussed

Document type :

Conference papers

Domain :

Engineering Sciences [physics] / Optics / Photonic

Engineering Sciences [physics] / Electronics

Complete list of metadatas

https://hal-ujm.archives-ouvertes.fr/ujm-01185888
Contributor : Sylvain Girard <>
Submitted on : Friday, August 21, 2015 - 9:59:31 PM
Last modification on : Monday, October 15, 2018 - 3:54:03 PM

Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

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Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

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