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Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

Vincent Goiffon 1 Franck Corbière 1 S. Rolando 1 Magali Estribeau 1 Pierre Magnan 1 B. Avon 1 J. Baer 1 M. Gaillardin 2 R. Molina 1 Philippe Paillet 2 Sylvain Girard 3 Aziouz Chabane 1 Claude Marcandella 2
1 ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace
2 DAM/DIF - DAM Île-de-France
3 LHC - Laboratoire Hubert Curien [Saint Etienne]
Abstract : The radiation hardness of a radiation-hardened-by-design CMOS Image Sensor is validated up to several MGy(SiO2) (>100 Mrad) of TID. The perspectives in terms of further improvements and applications are discussed
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Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-01185888
Contributor : Sylvain Girard <>
Submitted on : Friday, August 21, 2015 - 9:59:31 PM
Last modification on : Monday, January 13, 2020 - 5:46:05 PM

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  • HAL Id : ujm-01185888, version 1

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UNIV-ST-ETIENNE | CNRS | CEA | LAHC | IOGS | PARISTECH | UNIV-PARIS-SACLAY | DAM | UDL

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Vincent Goiffon, Franck Corbière, S. Rolando, Magali Estribeau, Pierre Magnan, et al.. Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests. Nuclear and Space Radiation Effects Conference (NSREC 2015), IEEE, Jul 2015, Boston, United States. ⟨ujm-01185888⟩

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