Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

Vincent Goiffon (1) , Franck Corbière (1) , S. Rolando (1) , Magali Estribeau (1) , Pierre Magnan (1) , B. Avon (1) , J. Baer (1) , M. Gaillardin (2) , R. Molina (1) , Philippe Paillet (2) , Sylvain Girard (3) , Aziouz Chabane (1) , Claude Marcandella (2)

1 ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace
2 DAM/DIF - DAM Île-de-France
3 LHC - Laboratoire Hubert Curien

The radiation hardness of a radiation-hardened-by-design CMOS Image Sensor is validated up to several MGy(SiO2) (>100 Mrad) of TID. The perspectives in terms of further improvements and applications are discussed

Domains: Engineering Sciences [physics]; Optics / Photonic; Engineering Sciences [physics]; Electronics

Vincent Goiffon, Franck Corbière, S. Rolando, Magali Estribeau, Pierre Magnan, et al.. Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests. Nuclear and Space Radiation Effects Conference (NSREC 2015), IEEE, Jul 2015, Boston, United States. ⟨ujm-01185888⟩