Skip to Main content Skip to Navigation
New interface
Conference papers

Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests

Vincent Goiffon 1 Franck Corbière 1 S. Rolando 1 Magali Estribeau 1 Pierre Magnan 1 B. Avon 1 J. Baer 1 M. Gaillardin 2 R. Molina 1 Philippe Paillet 2 Sylvain Girard 3 Aziouz Chabane 1 Claude Marcandella 2 
1 ISAE-SUPAERO - Institut Supérieur de l'Aéronautique et de l'Espace
2 DAM/DIF - DAM Île-de-France
3 LHC - Laboratoire Hubert Curien [Saint Etienne]
Abstract : The radiation hardness of a radiation-hardened-by-design CMOS Image Sensor is validated up to several MGy(SiO2) (>100 Mrad) of TID. The perspectives in terms of further improvements and applications are discussed
Document type :
Conference papers
Complete list of metadata
https://hal-ujm.archives-ouvertes.fr/ujm-01185888
Contributor : Sylvain Girard Connect in order to contact the contributor
Submitted on : Friday, August 21, 2015 - 9:59:31 PM
Last modification on : Sunday, June 26, 2022 - 12:04:00 PM

Identifiers

  • HAL Id : ujm-01185888, version 1

Collections

UNIV-ST-ETIENNE | CEA | CNRS | LAHC | DAM | UDL

Citation

Vincent Goiffon, Franck Corbière, S. Rolando, Magali Estribeau, Pierre Magnan, et al.. Multi-MGy Radiation Hardened CMOS Image Sensor: Design, Characterization and Total Ionizing Dose Tests. Nuclear and Space Radiation Effects Conference (NSREC 2015), IEEE, Jul 2015, Boston, United States. ⟨ujm-01185888⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

96