Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Amir Moungache 1 Bernard Bayard 2 Abakar Mahamat Tahir 1 Stéphane Robert 2 Damien Jamon 2 Frank Gambou 1
1 Faculté des sciences de N'Djaména
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
Abstract : This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a non-destructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.
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Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013. 〈10.1002/mop.28998〉
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Soumis le : mardi 25 octobre 2016 - 13:45:27
Dernière modification le : jeudi 26 juillet 2018 - 01:11:01

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UNIV-ST-ETIENNE | IOGS | PARISTECH | UNIV-PARIS-SACLAY

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Amir Moungache, Bernard Bayard, Abakar Mahamat Tahir, Stéphane Robert, Damien Jamon, et al.. Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013. 〈10.1002/mop.28998〉. 〈ujm-01385440〉

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