Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Amir Moungache 1 Bernard Bayard 2 Abakar Mahamat Tahir 1 Stéphane Robert 2 Damien Jamon 2 Frank Gambou 1
1 Faculté des sciences de N'Djaména
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
Abstract : This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a non-destructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.
Document type :
Journal articles
Complete list of metadatas

Cited literature [7 references]  Display  Hide  Download
https://hal-ujm.archives-ouvertes.fr/ujm-01385440
Contributor : Bernard Bayard <>
Submitted on : Tuesday, October 25, 2016 - 1:45:27 PM
Last modification on : Tuesday, April 2, 2019 - 2:27:27 AM

Links full text

istex

Identifiers

Collections

UNIV-ST-ETIENNE | PARISTECH | UNIV-PARIS-SACLAY | IOGS

Citation

Amir Moungache, Bernard Bayard, Abakar Mahamat Tahir, Stéphane Robert, Damien Jamon, et al.. Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013. ⟨10.1002/mop.28998⟩. ⟨ujm-01385440⟩

Export

BibTeX TEI DC DCterms EndNote

Share

Metrics

Record views

81

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD