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Article Dans Une Revue Microwave and Optical Technology Letters Année : 2015

Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Résumé

This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a non-destructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.

Dates et versions

ujm-01385440 , version 1 (25-10-2016)

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Citer

Amir Moungache, Bernard Bayard, Abakar Mahamat Tahir, Stéphane Robert, Damien Jamon, et al.. Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry. Microwave and Optical Technology Letters, 2015, 57 (4), pp.1006-1013. ⟨10.1002/mop.28998⟩. ⟨ujm-01385440⟩
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