Amir Moungache, Bernard Bayard, Abakar Mahamat Tahir, Stéphane Robert, Damien Jamon, et al.. Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry.
Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013.
⟨10.1002/mop.28998⟩.
⟨ujm-01385440⟩