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Université Jean Monnet – Saint-Etienne |  |
Journal articles
Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry
Abstract : This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a non-destructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.
Cited literature [7 references]
https://hal-ujm.archives-ouvertes.fr/ujm-01385440
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Tuesday, October 25, 2016 - 1:45:27 PM
Last modification on : Monday, February 22, 2021 - 5:46:05 PM
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Tuesday, October 25, 2016 - 1:45:27 PM
Last modification on : Monday, February 22, 2021 - 5:46:05 PM
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