Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry

Amir Moungache 1 Bernard Bayard 2 Abakar Mahamat Tahir 1 Stéphane Robert 2 Damien Jamon 2 Frank Gambou 1
1 Faculté des sciences de N'Djaména
2 LHC - Laboratoire Hubert Curien [Saint Etienne]
Abstract : This article introduces an original microwave ellipsometry method for the characterization of dielectric materials. It is a non-destructive technique based on the interaction between wave and material in the 26–40 GHz frequency range. The refraction index is obtained by measuring the rotation angle of the refracted wave polarization for different angular positions of the sample. The technique is then validated with polytetrafluoroethylene samples which refraction index is known.
Type de document :
Article dans une revue
Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013. 〈10.1002/mop.28998〉
Liste complète des métadonnées

Littérature citée [7 références]  Voir  Masquer  Télécharger
https://hal-ujm.archives-ouvertes.fr/ujm-01385440
Contributeur : Bernard Bayard <>
Soumis le : mardi 25 octobre 2016 - 13:45:27
Dernière modification le : jeudi 26 juillet 2018 - 01:11:01

Lien texte intégral

istex

Identifiants

Collections

UNIV-ST-ETIENNE | IOGS | PARISTECH | UNIV-PARIS-SACLAY

Citation

Amir Moungache, Bernard Bayard, Abakar Mahamat Tahir, Stéphane Robert, Damien Jamon, et al.. Measurement of refraction index of thick and nontransparent isotropic material using transmission microwave ellipsometry. Microwave and Optical Technology Letters, Wiley, 2015, 57 (4), pp.1006-1013. 〈10.1002/mop.28998〉. 〈ujm-01385440〉

Exporter

BibTeX TEI DC DCterms EndNote

Partager

Métriques

Consultations de la notice

44

Contact

support.ccsd.cnrs.fr
hal.support@ccsd.cnrs.fr
Logo CCSD