Radiofrequency characterization of fretting damage in electrical contact

Bilal Benarabi 1 Julie Laporte 2 Bernard Bayard 1 Siegfried Fouvry 3, 2 Jeremy Sautel 4
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 LTDS - Laboratoire de Tribologie et Dynamique des Systèmes
3 ECL - École Centrale de Lyon
4 Radiall
Document type :
Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-01385461
Contributor : Bernard Bayard <>
Submitted on : Friday, October 21, 2016 - 1:44:31 PM
Last modification on : Tuesday, August 13, 2019 - 11:58:02 AM

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  • HAL Id : ujm-01385461, version 1

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UNIV-ST-ETIENNE | EC-LYON | ENTPE | LTDS | LAHC | IOGS | PARISTECH | UNIV-PARIS-SACLAY

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Bilal Benarabi, Julie Laporte, Bernard Bayard, Siegfried Fouvry, Jeremy Sautel. Radiofrequency characterization of fretting damage in electrical contact. 5th Connectors symposium, Mar 2015, Lemgo, Germany. ⟨ujm-01385461⟩

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