Radiofrequency characterization of fretting damage in electrical contact

Bilal Benarabi; Julie Laporte; Bernard Bayard; Siegfried Fouvry; Jeremy Sautel

Conference Papers Year :

Radiofrequency characterization of fretting damage in electrical contact

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Bilal Benarabi

Function : Author

Laboratoire Hubert Curien [Saint Etienne]

Julie Laporte

Function : Author

Laboratoire de Tribologie et Dynamique des Systèmes

Bernard Bayard

Function : Author
PersonId : 10187
IdHAL : bernard-bayard-univ-st-etienne-fr
ORCID : 0000-0002-7294-8226
IdRef : 060454253

Laboratoire Hubert Curien [Saint Etienne]

Siegfried Fouvry

Function : Author
PersonId : 742361
IdHAL : siegfried-fouvry
ORCID : 0000-0002-8850-0645
IdRef : 087223279

École Centrale de Lyon

Laboratoire de Tribologie et Dynamique des Systèmes

Jeremy Sautel

Function : Author

Radiall

Domains

Engineering Sciences [physics] Electromagnetism

Bernard Bayard : Connect in order to contact the contributor

https://hal-ujm.archives-ouvertes.fr/ujm-01385461

Submitted on : Friday, October 21, 2016-1:44:31 PM

Last modification on : Wednesday, December 28, 2022-3:51:26 AM

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ujm-01385461 , version 1 (21-10-2016)

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HAL Id : ujm-01385461 , version 1

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Bilal Benarabi, Julie Laporte, Bernard Bayard, Siegfried Fouvry, Jeremy Sautel. Radiofrequency characterization of fretting damage in electrical contact. 5th Connectors symposium, Mar 2015, Lemgo, Germany. ⟨ujm-01385461⟩

Radiofrequency characterization of fretting damage in electrical contact

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