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Conference papers

Radiofrequency characterization of fretting damage in electrical contact

Bilal Benarabi 1 Julie Laporte 2 Bernard Bayard 1 Siegfried Fouvry 3, 2 Jeremy Sautel 4 
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
2 LTDS - Laboratoire de Tribologie et Dynamique des Systèmes
3 ECL - École Centrale de Lyon
4 Radiall
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Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-01385461
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Friday, October 21, 2016 - 1:44:31 PM
Last modification on : Tuesday, October 26, 2021 - 3:20:05 AM

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  • HAL Id : ujm-01385461, version 1

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UNIV-ST-ETIENNE | IOGS | CNRS | EC-LYON | ENTPE | LAHC | LTDS | PARISTECH | UNIV-PARIS-SACLAY | UDL

Citation

Bilal Benarabi, Julie Laporte, Bernard Bayard, Siegfried Fouvry, Jeremy Sautel. Radiofrequency characterization of fretting damage in electrical contact. 5th Connectors symposium, Mar 2015, Lemgo, Germany. ⟨ujm-01385461⟩

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