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Bernard Bayard : Connect in order to contact the contributor
https://hal-ujm.archives-ouvertes.fr/ujm-01385461
Submitted on : Friday, October 21, 2016-1:44:31 PM
Last modification on : Friday, March 24, 2023-2:53:03 PM
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- HAL Id : ujm-01385461 , version 1
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Bilal Benarabi, Julie Laporte, Bernard Bayard, Siegfried Fouvry, Jeremy Sautel. Radiofrequency characterization of fretting damage in electrical contact. 5th Connectors symposium, Mar 2015, Lemgo, Germany. ⟨ujm-01385461⟩
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