Characterization of the refractive index of anisotropic materials by microwave ellipsometry - Archive ouverte HAL Access content directly
Conference Papers Year :

Characterization of the refractive index of anisotropic materials by microwave ellipsometry

Hassane Gogo Ahmat Idriss
  • Function : Author
Laboratoire Hubert Curien
Bernard Bayard
Laboratoire Hubert Curien

Domains

Engineering Sciences [physics] Electromagnetism

Bernard Bayard  : Connect in order to contact the contributor

https://hal-ujm.archives-ouvertes.fr/ujm-01385466

Submitted on : Friday, October 21, 2016-1:50:05 PM

Last modification on : Friday, March 24, 2023-2:53:03 PM

Not file

Dates and versions

ujm-01385466 , version 1 (21-10-2016)

Identifiers

  • HAL Id : ujm-01385466 , version 1

Cite

Hassane Gogo Ahmat Idriss, Bernard Bayard. Characterization of the refractive index of anisotropic materials by microwave ellipsometry. 7th International Conference on Spectroscopic Ellipsometry, Jun 2016, Berlin, Germany. ⟨ujm-01385466⟩

Export

BibTeX TEI Dublin Core DC Terms EndNote Datacite

Collections

UNIV-ST-ETIENNE IOGS CNRS LAHC PARISTECH UDL
75 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More