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Characterization of the refractive index of anisotropic materials by microwave ellipsometry

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https://hal-ujm.archives-ouvertes.fr/ujm-01385466
Contributor : Bernard Bayard <>
Submitted on : Friday, October 21, 2016 - 1:50:05 PM
Last modification on : Monday, January 13, 2020 - 5:46:06 PM

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  • HAL Id : ujm-01385466, version 1

Citation

Hassane Gogo Ahmat Idriss, Bernard Bayard. Characterization of the refractive index of anisotropic materials by microwave ellipsometry. 7th International Conference on Spectroscopic Ellipsometry, Jun 2016, Berlin, Germany. ⟨ujm-01385466⟩

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