Characterization of the refractive index of anisotropic materials by microwave ellipsometry

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Conference papers
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https://hal-ujm.archives-ouvertes.fr/ujm-01385466
Contributor : Bernard Bayard <>
Submitted on : Friday, October 21, 2016 - 1:50:05 PM
Last modification on : Thursday, July 26, 2018 - 1:10:47 AM

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  • HAL Id : ujm-01385466, version 1

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Hassane Gogo Ahmat Idriss, Bernard Bayard. Characterization of the refractive index of anisotropic materials by microwave ellipsometry. 7th International Conference on Spectroscopic Ellipsometry, Jun 2016, Berlin, Germany. ⟨ujm-01385466⟩

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