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Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity

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https://hal-ujm.archives-ouvertes.fr/ujm-02021941
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Saturday, February 16, 2019 - 10:45:30 PM
Last modification on : Sunday, June 26, 2022 - 12:10:50 PM

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Radwan Dib, Didier Vincent, Ahmad Elrafhi. Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity. Microwave and Optical Technology Letters, 2019, 61 (1), pp.15-19. ⟨10.1002/mop.31499⟩. ⟨ujm-02021941⟩

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