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Journal Articles Microwave and Optical Technology Letters Year : 2019

Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity

Radwan Dib
  • Function : Author
  • PersonId : 774703
  • IdRef : 187846553
Laboratoire Telecom Claude Chappe
Didier Vincent
  • Function : Author
  • PersonId : 937490
Laboratoire Hubert Curien
Ahmad Elrafhi
  • Function : Author
Université de Technologie et des Sciences Appliquées libano-française [Liban]

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Engineering Sciences [physics] Electromagnetism

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https://hal-ujm.archives-ouvertes.fr/ujm-02021941

Submitted on : Saturday, February 16, 2019-10:45:30 PM

Last modification on : Friday, March 24, 2023-2:53:09 PM

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ujm-02021941 , version 1 (16-02-2019)

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Radwan Dib, Didier Vincent, Ahmad Elrafhi. Measurement of the electromagnetic properties of thin‐films using a microwave resonant cavity. Microwave and Optical Technology Letters, 2019, 61 (1), pp.15-19. ⟨10.1002/mop.31499⟩. ⟨ujm-02021941⟩

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