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Journal Articles International journal of advanced research Year : 2019

Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

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1
A Moungache
  • Function : Author
S. Robert

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ujm-02054770 , version 1 (02-03-2019)

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A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩
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