Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

A Moungache; B. Bayard; S. Robert

doi:10.21474/IJAR01/8413

Journal Articles International journal of advanced research Year : 2019

Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

, (1) , (1)

1

A Moungache

Function : Author

B. Bayard

Function : Author
PersonId : 10187
IdHAL : bernard-bayard-univ-st-etienne-fr
ORCID : 0000-0002-7294-8226
IdRef : 060454253

Laboratoire Hubert Curien [Saint Etienne]

S. Robert

Function : Author
PersonId : 10263
IdHAL : stephane-robert
IdRef : 077187717

Laboratoire Hubert Curien [Saint Etienne]

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Engineering Sciences [physics] Electromagnetism

Bernard Bayard : Connect in order to contact the contributor

https://hal-ujm.archives-ouvertes.fr/ujm-02054770

Submitted on : Saturday, March 2, 2019-10:22:29 AM

Last modification on : Wednesday, December 28, 2022-3:52:00 AM

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ujm-02054770 , version 1 (02-03-2019)

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HAL Id : ujm-02054770 , version 1
DOI : 10.21474/IJAR01/8413

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A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩

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Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

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