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Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

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https://hal-ujm.archives-ouvertes.fr/ujm-02054770
Contributor : Bernard Bayard <>
Submitted on : Saturday, March 2, 2019 - 10:22:29 AM
Last modification on : Tuesday, February 11, 2020 - 5:52:03 PM

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A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩

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