MICROWAVE ELLIPSOMETRY CHARACTERIZATION OF ISOTROPIC MATERIALS USING SIMULATED ANNEALING COMBINED WITH LEVENBERG-MARQUARDT ALGORITHM.

A Moungache B. Bayard 1 S. Robert 1
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
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Journal articles
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https://hal-ujm.archives-ouvertes.fr/ujm-02054770
Contributor : Bernard Bayard <>
Submitted on : Saturday, March 2, 2019 - 10:22:29 AM
Last modification on : Wednesday, April 3, 2019 - 1:52:04 AM

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  • HAL Id : ujm-02054770, version 1

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UNIV-ST-ETIENNE | IOGS | PARISTECH | UNIV-PARIS-SACLAY

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A Moungache, B. Bayard, S. Robert. MICROWAVE ELLIPSOMETRY CHARACTERIZATION OF ISOTROPIC MATERIALS USING SIMULATED ANNEALING COMBINED WITH LEVENBERG-MARQUARDT ALGORITHM.. International journal of advanced research, Dept. of Zoology Mata Jijabai Govt. P. G. Girls College, 2019, 7 (1), pp.994-1001. ⟨ujm-02054770⟩

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