A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm.
International journal of advanced research, International journal of advanced research, 2019, 7 (1), pp.994-1001.
⟨10.21474/IJAR01/8413⟩.
⟨ujm-02054770⟩