Skip to Main content Skip to Navigation
Journal articles

Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm

A Moungache B. Bayard 1 S. Robert 1 
1 LHC - Laboratoire Hubert Curien [Saint Etienne]
Document type :
Journal articles
Complete list of metadata
https://hal-ujm.archives-ouvertes.fr/ujm-02054770
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Saturday, March 2, 2019 - 10:22:29 AM
Last modification on : Sunday, June 26, 2022 - 12:10:59 PM

Links full text

openaccess

Identifiers

Collections

UNIV-ST-ETIENNE | CNRS | UDL

Citation

A Moungache, B. Bayard, S. Robert. Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm. International journal of advanced research, International journal of advanced research, 2019, 7 (1), pp.994-1001. ⟨10.21474/IJAR01/8413⟩. ⟨ujm-02054770⟩

Export

BibTeX TEI DC DCterms EndNote Datacite

Share

Metrics

Record views

53