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Université Jean Monnet – Saint-Etienne |  |
Journal articles
Microwave ellipsometry characterization of isotropic materials using simulated annealing combined with Levenberg-Marquardt algorithm
https://hal-ujm.archives-ouvertes.fr/ujm-02054770
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Saturday, March 2, 2019 - 10:22:29 AM
Last modification on : Thursday, January 7, 2021 - 4:26:01 PM
Contributor : Bernard Bayard Connect in order to contact the contributor
Submitted on : Saturday, March 2, 2019 - 10:22:29 AM
Last modification on : Thursday, January 7, 2021 - 4:26:01 PM
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