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Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift

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https://hal-ujm.archives-ouvertes.fr/ujm-02861487
Contributor : Damien Jamon Connect in order to contact the contributor
Submitted on : Tuesday, June 9, 2020 - 9:05:02 AM
Last modification on : Wednesday, November 3, 2021 - 6:29:51 AM

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Quentin Cridling, Renée Charrière, D. Jamon, Matthieu Lenci, Mariapia Pedeferri, et al.. Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift. Thin Solid Films, Elsevier, 2020, pp.138181. ⟨10.1016/j.tsf.2020.138181⟩. ⟨ujm-02861487⟩

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