Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift

Quentin Cridling (1, 2) , Renée Charrière (2, 1) , D. Jamon (3) , Matthieu Lenci (4, 2, 1) , Mariapia Pedeferri (5, 6) , David Delafosse Delafosse (2, 1)

1 LGF-ENSMSE - Laboratoire Georges Friedel
2 Mines Saint-Étienne MSE - École des Mines de Saint-Étienne
3 LHC - Laboratoire Hubert Curien
4 PMM-ENSMSE- Département Physique et Mécanique des Matériaux
5 CMIC - Department of Chemistry, Materials and Chemical Engineering "Giulio Natta"
6 POLIMI - Politecnico di Milano [Milan]

Domains: Physics [physics]

Quentin Cridling, Renée Charrière, D. Jamon, Matthieu Lenci, Mariapia Pedeferri, et al.. Anodized titanium oxide thickness estimation with ellipsometry, reflectance spectra extrema positions and electronic imaging: importance of the interfaces electromagnetic phase-shift. Thin Solid Films, 2020, pp.138181. ⟨10.1016/j.tsf.2020.138181⟩. ⟨ujm-02861487⟩