Analytical Approach of The High Susceptibility Frequencies of a Battery Management System During Direct Power Injection. Methods of Improvement

Badr Guendouz (1) , Kamel Abouda (1) , Alexandre Boyer (2) , Sonia Ben Dhia (2) , Olivier Tico (1) , Jérémy Ruau (1)

1 NXP Semiconductors
2 LAAS-ESE - Équipe Énergie et Systèmes Embarqués

When it comes to the electromagnetic interference (EMI) immunity of a Battery Management System Integrated Circuit (BMS IC), Printed Circuit Board (PCB) traces and external components (ECs) arrangement define the high susceptibility frequencies (HSF) of the IC during Direct Power Injection (DPI) tests. This work first aims at defining the root causes of those HSF in a realistic and measurement correlated environment, then, formulating them in order to provide a realistic prediction in the early design stages. Moreover, the configuration of the ECs raises a crucial tradeoff between the overall price of the system and the immunity of the IC. This work, then, also aims at analyzing this tradeoff and proposing alternative configurations of the ECs that reduce the overall price but also lead to lower injection levels during DPI.

Mots clés: BMS; PCB; Battery; Immunity; DPI; Resonance; Noise levels; EMC; Ladder Networks

Domaines: Sciences de l'ingénieur [physics]

Badr Guendouz, Kamel Abouda, Alexandre Boyer, Sonia Ben Dhia, Olivier Tico, et al.. Analytical Approach of The High Susceptibility Frequencies of a Battery Management System During Direct Power Injection. Methods of Improvement. IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY (EMC+SIPI 2023), Jul 2023, Grand Rapids, United States. ⟨10.1109/EMCSIPI50001.2023.10241599⟩. ⟨hal-04203286⟩