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PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community

Abstract : Physically Unclonable Functions (PUFs) allow to extract unique fingerprints from silicon chips. The applications are numerous: chip identification, chip master key extraction, authentication protocol, unique seeding, etc. However, secure usage of PUF requires some precautions. This paper reviews industrial concerns associated with PUF operation, including those occurring before and after market. Namely, starting from PUF “secure”specifications, aligned with state-of-the-art standards, we explore innovative techniques to handle enrollment and subsequent PUF queries, in nominal as well as in adversarial environment.
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https://hal.archives-ouvertes.fr/hal-02999226
Contributor : Laurence Ben Tito <>
Submitted on : Tuesday, November 17, 2020 - 10:10:39 AM
Last modification on : Tuesday, September 21, 2021 - 2:16:05 PM
Long-term archiving on: : Thursday, February 18, 2021 - 6:35:37 PM

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ETS2020_PUF.pdf
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Distributed under a Creative Commons Attribution - NonCommercial 4.0 International License

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  • HAL Id : hal-02999226, version 1

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Amir Ali Pour, Vincent Beroulle, Bertrand Cambou, Jean-Luc Danger, Giorgio Di Natale, et al.. PUF Enrollment and Life Cycle Management: Solutions and Perspectives for the Test Community. IEEE European Test Symposium (ETS 2020), May 2020, Tallinn, Estonia. pp.1-10. ⟨hal-02999226⟩

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