The effect of deposition and annealing conditions on crystallographic properties of sputter barium ferrite thick films

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https://hal-ujm.archives-ouvertes.fr/ujm-00356482
Contributor : Jean-Pierre Chatelon <>
Submitted on : Tuesday, January 27, 2009 - 3:43:43 PM
Last modification on : Monday, February 25, 2019 - 4:34:17 PM

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  • HAL Id : ujm-00356482, version 1

Citation

B. Bayard, Jean-Pierre Chatelon, M. Le Berre, H. Joisten, J.J. Rousseau, et al.. The effect of deposition and annealing conditions on crystallographic properties of sputter barium ferrite thick films. Sensors and Actuators A: Physical , Elsevier, 2002, 99 (1-2), pp.207-212. ⟨ujm-00356482⟩

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