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Journal Articles Thin Solid Films Year : 2009

Application of neural classification in ellipsometry for robust thin films characterization

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Issam Gereige
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Robert Stéphane
Dispositifs et Instrumentation en Optoélectronique et micro-ondes

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Physics [physics] Physics [physics] Optics [physics.optics] Engineering Sciences [physics] Optics / Photonic

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https://hal-ujm.archives-ouvertes.fr/ujm-00428541

Submitted on : Thursday, October 29, 2009-9:14:27 AM

Last modification on : Monday, December 12, 2022-5:26:11 PM

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ujm-00428541 , version 1 (29-10-2009)

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Issam Gereige, Robert Stéphane. Application of neural classification in ellipsometry for robust thin films characterization. Thin Solid Films, 2009. ⟨ujm-00428541⟩

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