Application of neural classification in ellipsometry for robust thin films characterization

Issam Gereige Robert Stéphane 1
1 DIOM - Dispositifs et Instrumentation en Optoélectronique et micro-ondes
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Journal articles
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https://hal-ujm.archives-ouvertes.fr/ujm-00428541
Contributor : Issam Gereige <>
Submitted on : Thursday, October 29, 2009 - 9:14:27 AM
Last modification on : Thursday, March 7, 2019 - 12:14:04 PM

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Issam Gereige, Robert Stéphane. Application of neural classification in ellipsometry for robust thin films characterization. Thin Solid Films, Elsevier, 2009. ⟨ujm-00428541⟩

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