SEU prediction from SET Modeling using multi-node collection in Bulk transistors and SRAMs down to the 65nm technology node

Abstract : A new methodology of prediction for SEU is proposed based on SET modeling. The modeling of multi-node charge collection is performed using the ADDICT model for predicting single event transients and upsets in bulk transistors and SRAMs down to 65 nm. The predicted single event upset cross sections agree well with experimental data for SRAMs.
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https://hal-ujm.archives-ouvertes.fr/ujm-01011671
Contributor : Sylvain Girard <>
Submitted on : Tuesday, June 24, 2014 - 12:00:07 PM
Last modification on : Thursday, August 22, 2019 - 2:44:01 PM

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L. Artola, G. Hubert, K. Warren, M. Gaillardin, R.D Shrimpf, et al.. SEU prediction from SET Modeling using multi-node collection in Bulk transistors and SRAMs down to the 65nm technology node. IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.1338 - 1346. ⟨10.1109/TNS.2011.2144622⟩. ⟨ujm-01011671⟩

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