L. Artola, G. Hubert, K. Warren, M. Gaillardin, R.D Shrimpf, et al.. SEU prediction from SET Modeling using multi-node collection in Bulk transistors and SRAMs down to the 65nm technology node.
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2011, 58 (3), pp.1338 - 1346.
⟨10.1109/TNS.2011.2144622⟩.
⟨ujm-01011671⟩